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| AT25F512A (AT39505) SPI EEPROM Product Qualification * 2325 Orchard Parkway * San Jose CA 95131 * The AT25F512A Serial Peripheral Interface EEPROM is fabricated on the AT39500 CMOS process. All tests were performed at Atmel's Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT25F512 SPI EEPROM. Package specific qualification data is available separately. * 2325 Orchard Parkway * San Jose CA 95131 * AT39505 Product Qualification ESD Characterization ORYX Model 11000 ESD Test System Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester Quantity Tested: 3/Lot/Voltage Device:AT25F512A Human Body Model Testing - Mil Std 883, Method 3015 Lot Number: 3j1286 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 500V 2000V Name 1000V 4000V Vcc Power Vcc 3/0 3/0 3/0 3/2 3/0 3000 Gnd Ground Gnd 3/0 3/0 3/0 3/2 3/0 3000 A0 Address Input 3/0 3/0 3/0 3/2 3/0 3000 A1 Address Input 3/0 3/0 3/0 3/2 3/0 3000 A2 Address Input 3/0 3/0 3/0 3/2 3/0 3000 WP Write Protect Input 3/0 3/0 3/0 3/2 3/0 3000 SCL Serial Clock Input Input 3/0 3/0 3/0 3/2 3/0 3000 SDA Serial Data Input/Output 3/0 3/0 3/0 3/2 3/0 3000 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 3/2 3/0 3000 Machine Model Testing - JEDEC Std 22A, Method 115A Lot Number: 3j1286 1 Positive & 1 Negative Pulse per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 50V 150V Name 100V 200V Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 150 Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 150 A0 Address Input 3/0 3/0 3/0 3/3 3/0 150 A1 Address Input 3/0 3/0 3/0 3/3 3/0 150 A2 Address Input 3/0 3/0 3/0 3/3 3/0 150 WP Write Protect Input 3/0 3/0 3/0 3/3 3/0 150 SCL Serial Clock Input Input 3/0 3/0 3/0 3/3 3/0 150 SDA Serial Data Input/Output 3/0 3/0 3/0 3/3 3/0 150 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 3/3 3/0 150 * 2325 Orchard Parkway * San Jose CA 95131 * AT39505 Product Qualification Latch-Up Characterization Device: AT25F512 Lot Number: Lot# 3j1286 Quantity Tested: 3 per lot Test Method: JEDEC 78 Final Production Test Program: EPRO Model 142AX Tester @ 25C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Max Trigger Current Pin Name Vcc Gnd CS Hold SI WP SCK SO Passing* Tested As -I (mA) Vcc Gnd Input Input Input Input Input Output ----200 200 200 200 200 200 Passing* +I (mA) ----200 200 200 200 200 200 Max Trigger Voltage Function Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT Complianc Passing* Passing* Compliance e Setting +V (V) Setting (mA) -V (V) (V) ----7.0 250 --------7.0 ------7.0 ------7.0 ------7.0 ------7.0 ------7.0 ------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT25F512A Lot Number: Lot# 3j1286 Quantity Tested: 100 Test Temperature: 25C Vcc: 3.6 Volts Write Mode: Page Highest Passing Cycles: 10,000 Cycles To First Failure: NA * 2325 Orchard Parkway * San Jose CA 95131 * |
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